Алгоритмы тестирования железа

Тема в разделе "MS Visual C++", создана пользователем bl4iD, 21 дек 2004.

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  1. bl4iD

    bl4iD Гость

    Появилась задача по тестированию аппаратной части компьютера, т.е. практически всех его частей (CPU, video, HDD, etc.)
    Может кто знает ссылки где об этом можно почитать, может форумы какие есть....
    Буду очень благодарен....
  2. bel_nikita

    bel_nikita Гость

    Довольно интересно.
    Такая же задача стоит перед мной :huh:
  3. ????

    ???? Гость

    именно тестированию? или определению ху-из-ху?
    исли именно тестированию, то даже на тестировании памяти можно "загнуться" если делать всё на "отлично".
  4. bl4iD

    bl4iD Гость

    Именно тестиррованию.... т.е Запись\чтение в память по адресам попарядку и рандомам, запуск самотестирования ЦП, диагностика винта.... Вот ну хотя бы это....
  5. ????

    ???? Гость

    Видел утилитку Memtest86? Memtest86 is released under the terms of the Gnu Public License (GPL). Так что смотри исходники :( Вещь ооооооооооооооооочень хорошая.
  6. bl4iD

    bl4iD Гость

    Был на сайте на этом, нашел там только исходники под Linux, а в нем я не шарю :( ... Так пару раз дома ставил ради интереса и все....
  7. ????

    ???? Гость

    Memtest86 is thorough, stand alone memory test for Intel i386 architecture systems. BIOS based memory tests are only a quick check and often miss failures that are detected by Memtest86. Т.е. Linux сдесь не причём - просто под ним собиралась эта утилитка.
    На всякий случай теорию из readme:
    Код (Text):
    11) Memtest86 Test Algorithms
    Memtest86 uses two algorithms that provide a reasonable approximation
    of the ideal test strategy above. The first of these strategies is called
    moving inversions. The moving inversion test works as follows:

    1) Fill memory with a pattern
    2) Starting at the lowest address
    2a check that the pattern has not changed
    2b write the patterns complement
    2c increment the address
    repeat 2a - 2c
    3) Starting at the highest address
    3a check that the pattern has not changed
    3b write the patterns complement
    3c decrement the address
    repeat 3a - 3c

    This this algorithm is a good approximation of an ideal memory test but
    there are some limitations. Most high density chips today store data
    4 to 16 bits wide. With chips that are more than one bit wide it
    is impossible to selectively read or write just one bit. This means
    that we cannot guarantee that all adjacent cells have been tested
    for interaction. In this case the best we can do is to use some
    patterns to insure that all adjacent cells have at least been written
    with all possible one and zero combinations.

    It can also be seen that caching, buffering and out of order execution
    will interfere with the moving inversions algorithm and make less effective.
    It is possible to turn off cache but the memory buffering in new high
    performance chips can not be disabled. To address this limitation a new
    algorithm I call Modulo-X was created. This algorithm is not affected by
    cache or buffering. The algorithm works as follows:
    1) For starting offsets of 0 - 20 do
    1a write every 20th location with a pattern
    1b write all other locations with the patterns complement
     repeat 1b one or more times
    1c check every 20th location for the pattern

    This algorithm accomplishes nearly the same level of adjacency testing
    as moving inversions but is not affected by caching or buffering. Since
    separate write passes (1a, 1b) and the read pass (1c) are done for all of
    memory we can be assured that all of the buffers and cache have been
    flushed between passes. The selection of 20 as the stride size was somewhat
    arbitrary. Larger strides may be more effective but would take longer to
    execute. The choice of 20 seemed to be a reasonable compromise between
    speed and thoroughness.

    12) Individual Test Descriptions
    Memtest86 executes a series of numbered test sections to check for
    errors. These test sections consist of a combination of test
    algorithm, data pattern and caching. The execution order for these tests
    were arranged so that errors will be detected as rapidly as possible.
    Tests 8, 9, 10, 11 and 12 are very long running extended tests and are only
    executed when extended testing is selected. The extended tests have a
    low probability of finding errors that were missed by the default tests.
    A description of each of the test sections follows:

    Test 0 [Address test, walking ones, no cache]
    Tests all address bits in all memory banks by using a walking ones
    address pattern. Errors from this test are not used to calculate
    BadRAM patterns.

    Test 1 [Moving Inv, ones&zeros, cached]
    This test uses the moving inversions algorithm with patterns of only
    ones and zeros. Cache is enabled even though it interferes to some
    degree with the test algorithm. With cache enabled this test does not
    take long and should quickly find all "hard" errors and some more
    subtle errors. This section is only a quick check.

    Test 2 [Address test, own address, no cache]
    Each address is written with its own address and then is checked
    for consistency. In theory previous tests should have caught any
    memory addressing problems. This test should catch any addressing
    errors that somehow were not previously detected.

    Test 3 [Moving inv, 8 bit pat, cached]
    This is the same as test 1 but uses a 8 bit wide pattern of
    "walking" ones and zeros. This test will better detect subtle errors
    in "wide" memory chips. A total of 20 data patterns are used.

    Test 4 [Moving inv, 32 bit pat, cached]
    This is a variation of the moving inversions algorithm that
    shifts the data pattern left one bit for each successive address.
    The starting bit position is shifted left for each pass. To use
    all possible data patterns 32 passes are required. This test is
    very effective at detecting data sensitive errors in "wide" memory

    Test 5 [Block move, 64 moves, cached]
    This test stresses memory by using block move (movsl) instructions
    and is based on Robert Redelmeier's burnBX test. Memory is initialized
    with shifting patterns that are inverted every 8 bytes. Then 4MB blocks
    of memory are moved around using the movsl instruction. After the moves
    are completed the data patterns are checked. Because the data is checked
    only after the memory moves are completed it is not possible to know
    where the error occurred. The addresses reported are only for where the
    bad pattern was found. Since the moves are constrained to a 8MB segment
    of memory the failing address will always be lest than 8MB away from the
    reported address. Errors from this test are not used to calculate
    BadRAM patterns.

    Test 6 [Modulo 20, ones&zeros, cached]
    Using the Modulo-X algorithm should uncover errors that are not
    detected by moving inversions due to cache and buffering interference
    with the the algorithm. As with test one only ones and zeros are
    used for data patterns.

    Test 7 [Moving inv, ones&zeros, no cache]
    This is the same as test one but without cache. With cache off
    there will be much less interference with the test algorithm.
    However, the execution time is much, much longer. This test may
    find very subtle errors missed by tests one and two.

    Test 8 [Block move, 512 moves, cached]
    This is the same as test #5 except that we do a lot more memory moves
    before checking memory. Errors from this test are not used to calculate
    BadRAM patterns.

    Test 9 [Moving inv, 8 bit pat, no cache]
    This is the first extended test. By using an 8 bit pattern with
    cache off this test should be effective in detecting all types of
    errors. However, it takes a very long time to execute and there is
    a low probability that it will detect errors not found by the previous

    Test 10 [Modulo 20, 8 bit, cached]
    This is the first test to use the modulo 20 algorithm with a data
    pattern other than ones and zeros. This combination of algorithm and
    data pattern should be quite effective. However, it's very long
    execution time relegates it to the extended test section.

    Test 11 [Moving inv, 32 bit pat, no cache]
    This test should be the most effective in finding errors that are
    data pattern sensitive. However, without cache it's execution time
    is excessively long.

    Test 12 [Bit fade test, 90 min, 2 patterns]
    The bit fade test initializes all of memory with a pattern and then
    sleeps for 90 minutes. Then memory is examined to see if any memory bits
    have changed. All ones and all zero patterns are used. Since this test
    takes 6+ hours to complete plan to let this one run overnight.
    А собрать можно и под WIN. Если получится - отпишу.
  8. bel_nikita

    bel_nikita Гость

  9. Dico

    Dico Гость

    Пиши на мыло Dico1@list.ru помогу сдокай и примерами. Только конкретезируй что именно надо!!!
  10. Dico

    Dico Гость

    Пиши на мыло Dico1@list.ru помогу с докай и примерами. Только конкретезируй что именно надо!!!
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